The semiconductor industry relies on quantitative nanoscale imaging to inspect devices and components. This project will develop non-destructive, quantitative coherent diffraction imaging techniques compatible with modern and future semiconductor device architectures. What you will do The semiconductor industry routinely relies on nanoscale imaging methodologies for inspection and characterization of nanoscale features in devices and components. However, many of these metrologies are destructive, compatible with a limited sample set, or Read More …